ASTM E1462-2000(2006) 光电器件模块的完整性绝缘和连续地面路径的标准试验方法

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【英文标准名称】:StandardTestMethodsforInsulationIntegrityandGroundPathContinuityofPhotovoltaicModules
【原文标准名称】:光电器件模块的完整性绝缘和连续地面路径的标准试验方法
【标准号】:ASTME1462-2000(2006)
【标准状态】:现行
【国别】:
【发布日期】:2000
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:E44.09
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:试验;光电器件;绝缘
【英文主题词】:dielectricvoltagewithstand;electricaltesting;groundpathcontinuity;insulationintegrity;insulationresistance;modules;photovoltaics;solarenergy
【摘要】:Thedesignofaphotovoltaicmoduleorsystemintendedtoprovidesafeconversionofthesunrsquo;radiantenergyintousefulelectricitymusttakeintoconsiderationthepossibilityofhazardshouldtheusercomeintocontactwiththeelectricalpotentialofthemodule.Thesetestmethodsdescribeproceduresforverifyingthatthedesignandconstructionofthemoduleorsystemarecapableofprovidingprotectionfromshockthroughnormalinstallationanduse.Atnolocationonthemoduleshouldthiselectricalpotentialbeaccessible,withtheobviousexceptionoftheintendedoutputleads.Thesetestmethodsdescribeproceduresfordeterminingtheabilityofthemoduletoprovideprotectionfromelectricalhazards.Theseproceduresmaybespecifiedaspartofaseriesofqualificationtestsinvolvingenvironmentalexposure,mechanicalstress,electricaloverload,oracceleratedlifetesting.Theseproceduresarenormallyintendedforuseondrymodules;however,thetestmodulesmaybeeitherwetordry,asindicatedbytheappropriateprotocol.Theseproceduresmaybeusedtoverifymoduleassemblyonaproductionline.Insulationresistanceandleakagecurrentarestrongfunctionsofmoduledimensions,ambientrelativehumidityandabsorbedwatervapor,andthegroundpathcontinuityprocedureisstronglyaffectedbythelocationofcontactsandtestleadstothemoduleframeandgroundingpoints.5.6.1Forthesereasons,itistheresponsibilityoftheuserofthesetestmethodstospecifythemaximumacceptableleakagecurrentforthedielectricvoltagewithstandtest,andthemaximumacceptableresistanceforthegroundpathcontinuityprocedure.5.6.2Fiftyx03BC;Ahasbeencommonlyusedasthemaximumacceptableleakagecurrent(seeANSI/UL1703,Section26.1),and0.1x03A9;hasbeencommonlyusedasthemaximumacceptableresistance.Somemoduledesignsmaynotuseanyexternalmetalliccomponentsandthuslackagroundpointdesignatedbythemodulemanufacturer.Inthesecases,thegroundpathcontinuitytestisnotapplicable.1.1Thesetestmethodscoverproceduresfor(1)testingforcurrentleakagebetweentheelectricalcircuitofaphotovoltaicmoduleanditsexternalcomponentswhileauser-specifiedvoltageisappliedand(2)fortestingforpossiblemoduleinsulationbreakdown(dielectricvoltagewithstandtest).1.2Aprocedureisdescribedformeasuringtheinsulationresistancebetweentheelectricalcircuitofaphotovoltaicmoduleanditsexternalcomponents(insulationresistancetest).1.3Aprocedureisprovidedforverifyingthatelectricalcontinuityexistsbetweentheexposedexternalconductivesurfacesofthemodule,suchastheframe,structuralmembers,oredgeclosures,anditsgroundingpoint(groundpathcontinuitytest).1.4Thistestmethoddoesnotestablishpassorfaillevels.Thedeterminationofacceptableorunacceptableresultsisbeyondthescopeofthistestmethod.1.5ThereisnosimilarorequivalentISOstandard.Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:L50
【国际标准分类号】:27_160
【页数】:4P.;A4
【正文语种】: